Model-Based Top-Down Flow for Safety Related Automotive Battery Management ICs | NXP Semiconductors

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Model-Based Top-Down Flow for Safety Related Automotive Battery Management ICs

Model-Based Top-Down Flow for Safety Related Automotive Battery Management ICs

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About This Training

This video offers a review of a model-based top-down development flow for automotive semiconductors in safety related battery management applications. Where other semiconductor flows work mainly bottom-up on silicon faults, we concentrate first on functionality to achieve functional safety. Starting from top level requirements, a function-oriented breakdown of the system behavior is modeled in SysML.

It enables model-based safety analyses that indicate where malfunctions can impact the system behavior and mitigation is required to ensure system safety. This is followed by step-by-step refinement in similar phases: the model is refined according to the requirements, then an analysis step is done that leads to new requirements.

Finally, this results in an IC architecture that fulfills the safety requirements and therefore implements the safety concept. The flow is illustrated by a novel battery monitoring IC architecture that supports high safety demands as well as high performance.

Presentation

Model-Based Top-Down Flow for Safety Related Automotive Battery Management ICs

Presented by

Ralph Görgen
Principal Engineer, NXP Semiconductors
Markus Hafermalz

Systems and Applications Engineer, NXP Semiconductors

期間

30 min

言語

英語

スキルレベル

中級

0閲覧数2いいね

We are looking for ways to improve.

アンケートに答える。

Additional Resources

Vehicle Electrification Solutions Brochure

Battery Cell Controllers

Related Trainings

NXP Technology Days Automotive

Electrification Academy

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