MMA2204KEG 製品情報|NXP

購入オプション

MMA2204KEG

生産終了 (EOL)

12NC: 935322996574

詳細

注文

MMA2204KEGR2

生産終了 (EOL)

12NC: 935322996518

詳細

注文

操作機能

パラメータ
Security Status
COMPANY PUBLIC
Description
Analog Accelerometer, 5V, X, 100g, SOIC 16
パラメータ
Number of pins
16
Package Style
SO

環境

Part/12NC鉛フリーEU RoHSハロゲンフリーRHFインジケーター2次インターコネクトREACH SVHCWeight (mg)
MMA2204KEG(935322996574)
No
Yes
Certificate Of Analysis (CoA)
No
E
e3
REACH SVHC
609.2
MMA2204KEGR2(935322996518)
No
Yes
Certificate Of Analysis (CoA)
No
E
e3
REACH SVHC
609.2

品質

Part/12NC安全保障機能安全吸湿感度レベル (MSL)Peak Package Body Temperature (PPT) (C°)Maximum Time at Peak Temperatures (s)
鉛はんだ鉛はんだ鉛フリーはんだ鉛はんだ鉛フリーはんだ
MMA2204KEG
(935322996574)
No
3
250
250
30
30
MMA2204KEGR2
(935322996518)
No
3
250
250
30
30

配送

Part/12NC関税分類番号(米国)免責事項:輸出規制品目番号(米国)
MMA2204KEG
(935322996574)
854239
EAR99
MMA2204KEGR2
(935322996518)
854239
EAR99

製造終了品・代替品データ

Part/12NC製造終了のお知らせ最終購入日 最終納品日交換
MMA2204KEG
(935322996574)
NOTICE
2019-12-31
2020-12-31
MMA6855BKCWR2
(935315465528)
MMA2204KEGR2
(935322996518)
NOTICE
2019-12-31
2020-12-31
MMA6855BKCWR2
(935315465528)

製品変更のお知らせ

Part/12NC発行日有効期限PCNタイトル
MMA2204KEG
(935322996574)
2025-04-162025-05-26202504007IFreescale Logo to NXP Logo Product Marking Conversion for All Remaining Former Freescale Products
MMA2204KEGR2
(935322996518)
MMA2204KEG
(935322996574)
2020-12-152020-12-16202011011INXP Will Add a Sealed Date to the Product Label
MMA2204KEGR2
(935322996518)
MMA2204KEG
(935322996574)
2018-12-192018-12-20201711018DNU02Product Discontinuation Notice - Align SOIC EOL Dates
MMA2204KEGR2
(935322996518)

詳細 MMA2204

The MMA2204 series of silicon capacitive, micro-machined accelerometers features signal conditioning, 4-pole low pass filter, and temperature compensation.

  • Targets vibration monitoring/recording, appliance controls, hard drive protection, mouse/joysticks, virtual reality input, and sport diagnostics
  • Includes factory-set zero-g offset full-scale span and filter cut-off; requires no external devices
  • Verifies system functionality via full-system self-test capability