201711004I:MC9328MX21 MC56F825x/MC56F824x 56F8013 Final Test Site Expansion from NXP-ATTJ to KESC Tianjin China
  • 製品変更通知 (PCN)
  • 201711004I

201711004I : MC9328MX21 MC56F825x/MC56F824x 56F8013 Final Test Site Expansion from NXP-ATTJ to KESC Tianjin China

NXP Semiconductors announces the Final Test site expansion for the MC9328MX21 MC56F825x/MC56F824x 56F8013 product associated with this notification from the current NXP-ATTJ Tianjin China Final Test site to the KESC Tianjin China Final Test site. Final Test site transfer was successfully qualified adhering to NXP specifications. Corresponding ZVEI Delta Qualification Matrix ID: SEM-TF-01Please see the attached files for additional details.

PCNタイプ カテゴリー変更 発行日 有効期限
Customer Information Notification Test location 21-Dec-2017 19-Jan-2018

変更理由

Qualification of KESC Tianjin China is required for manufacturing flexibility and customer supply assurance.

対象製品の特定について

Product identification does not change

予想される影響

データシートの改訂: No impact to existing datasheet

There is no change to product form fit function or reliability.

対象品番

品番/12NC 最終購入日 最終納品日 交換品番
MC56F8246VLF
(935321556557)
- - -
MC56F8246VLFR
(935321556528)
- - -
MC9328MX21CVK
(935316662557)
- - -
MC9328MX21DVK
(935322225557)
- - -
S56F8013W3MFAE
(935314709557)
- - -