201801012F01 : i.MX 6SoloX MAPBGA17X17 and MAPBGA14X14 Room Test Elimination at Final Test
NXP Semiconductors announces the room temperature test elimination from the Final Test production flow for i.MX 6SoloX MAPBGA17X17 and MAPBGA14X14 devices associated with this notification. Room test performance is covered by Probe Test and the remaining Final Test production flow. Current Production Final Test Flow:Hot Final Test - Cold Final Test - Room Final Test with in-line QA Gate TestsNew Production Final Test Flow:Hot Final Test - Cold Final Test with in-line QA Gate TestsThis evaluation has been successfully completed according to NXP specifications.Corresponding ZVEI Delta Qualification Matrix ID: SEM-QG-01
| PCNタイプ | カテゴリー変更 | 発行日 | 有効期限 |
|---|---|---|---|
| Final Product Change Notification | Test process | 14-Feb-2018 | 15-May-2018 |
変更理由
Qualification of room temperature test elimination for improved capacity and customer supply assurance
対象製品の特定について
Product identification does not change
予想される影響
No impact on form fit function reliability or quality.
対象品番
| 品番／12NC | 最終購入日 | 最終納品日 | 交換品番 |
|---|---|---|---|
|
MCIMX6X1AVK08AB (935315934557) |
- | - | - |
|
MCIMX6X1AVK08AC (935363026557) |
- | - | - |
|
MCIMX6X1AVO08AB (935323753557) |
- | - | - |
|
MCIMX6X1AVO08AC (935353852557) |
- | - | - |
|
MCIMX6X1AVO08ACR (935353852518) |
- | - | - |
|
MCIMX6X2AVN08AB (935315812557) |
- | - | - |
|
MCIMX6X2AVN08AC (935363894557) |
- | - | - |