202207012I : MC56F837xxA Cold Test Elimination
NXP Semiconductors announces cold temperature test elimination from the Final Test production flow for the MC56F837xxA associated with this notification. Cold test performance is covered by Probe Test and the remaining Final Test production flow. Current Production Final Test Flow: ROOM Final Test - HOT Final Test - COLD Final Test with in-line QA Gate Tests New Production Final Test Flow: ROOM Final Test - HOT Final Test with in-line QA Gate Tests This evaluation has been successfully completed according to NXP specifications. Corresponding ZVEI Delta Qualification Matrix ID: SEM-QG-01
| PCNタイプ | カテゴリー変更 | 発行日 | 有効期限 |
|---|---|---|---|
| Customer Information Notification | Test process | 28-Jul-2022 | 25-Aug-2022 |
変更理由
Qualification of cold temperature test elimination for improved capacity and customer supply assurance.
対象品番
| 品番／12NC | 最終購入日 | 最終納品日 | 交換品番 |
|---|---|---|---|
|
MC56F83763AMLHA (935406667557) |
- | - | - |
|
MC56F83763AVLHA (935406668557) |
- | - | - |
|
MC56F83769AMLLA (935406669557) |
- | - | - |
|
MC56F83769AVLLA (935406671557) |
- | - | - |
|
MC56F83783AMLHA (935406672557) |
- | - | - |
|
MC56F83783AVLHA (935406673557) |
- | - | - |
|
MC56F83789AMLLA (935406674557) |
- | - | - |
|
MC56F83789AVLLA (935406675557) |
- | - | - |
|
MWCT2013AVLH (935409518557) |
- | - | - |
|
MWCT20C3AVLH (935409519557) |
- | - | - |
|
MWCT22C3AVLH (935409521557) |
- | - | - |
|
MWCT22C3AVLL (935409522557) |
- | - | - |