Delta and Impact of the ISO 26262 and IEC 61508 Standards for Designing Next-Generation Solutions | NXP Semiconductors

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Delta and Impact of the ISO 26262 and IEC 61508 Standards for Designing Next-Generation Solutions

Delta and Impact of the ISO 26262 and IEC 61508 Standards for Designing Next-Generation Solutions

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About This Training

What are the differences between the ISO 26262 and IEC 61508 standards? We will present the commonalities and differences of the two functional safety standards and the tailoring we implement with our BCaM7 process certified by TUV SUD as compliant with both standards.

Presentation

Delta and Impact of the ISO 26262 and IEC 61508 Standards for Designing Next-Generation Solutions

Presented by

Anamaria Hutuleac
CTO Functional Safety, NXP Semiconductors

期間

48 min

言語

英語

スキルレベル

初級編

0閲覧数4いいね

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Additional Resources

i.MX RT Crossover MCUs

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Safety Academy

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