A2T23H200W23SR6

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With this information, we can provide data to our customers to facilitate any assessment regarding compliance to the RoHS directive and lead-free status.
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Please see also our Restricted Substances Declaration.

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NXP Semiconductors
Product content declaration of A2T23H200W23SR6Last Revision (GMT):
Thursday, 24 July 2025, 08:04:00 PM
Part TypePackage VersionPackage NameTotal part
weight
EnvironmentTermination2nd Level InterconnectFor more information:
Halogen Free (Cl+Br)Lead Free (Pb)EU RoHS CompliantPlatingBase Alloy
A2T23H200W23SR6SOT1800CFM6F1380.618131 mg YesYesYesNickel/Palladium/Gold (Ni/Pd/Au)Cu alloye4contact us
Manufacturer Part Number (MPN)Effective DateVersionPb-free solderingSnPb solderingNumber of processing cyclesManufacturing
Moisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperatureMoisture Sensitivity Level
/ Floor Life
Peak Package temperatureMax time at peak temperature
9353 471 171282025-10-08LNA / Not Available26040 sec.Not ApplicableNot ApplicableNot Applicable3Kuala Lumpur, Malaysia
SubpartHomogeneous MaterialSubstanceCAS numberMass(mg)Mass(%) of
Material
Mass(%) of
Total part
CategoryDescription
Bonding Wire - AlBonding Wire - AlAluminum and its compoundsAluminum, metal7429-90-5175.91897198.84000012.742044
Inorganic Silicon compoundsSilicon7440-21-32.0468111.1500000.148253
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0071190.0040000.000516
Nickel and its compoundsNickel, metal7440-02-00.0106790.0060000.000773
Subtotal177.983581100.000000012.891587
CapCapGuanidine compounds1-cyanoguanidine461-58-51.0018400.1400000.072565
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.9016560.1260000.065308
Organic Silicon compounds[3-(2,3-epoxypropoxy)propyl]trimethoxysilane2530-83-80.1001840.0140000.007256
Organic compounds3,3'-(4-Methylbenzene-1,3-diyl)bis(1,1-dimethylurea)17526-94-20.5009200.0700000.036282
PolymersAcrylonitrile-methyl-methacrylate-vinylidene chloride copolymer25036-25-33.0055200.4200000.217694
PolymersBisphenol A, formaldehyde, epichlorohydrin polymer28906-96-94.0073600.5600000.290258
PolymersProprietary Material-Other acrylic/epoxy resin mixture705.58160098.60000051.106210
Titanium and its compoundsTitanium dioxide1317-70-00.5009200.0700000.036282
Subtotal715.600000100.000000051.831856
Copper Lead-Frame, Pre-Plated NiPdAuCopper Lead-Frame, Pre-Plated NiPdAuCopper and its compoundsCopper, metal7440-50-8275.24697864.65750019.936503
Gold and its compoundsGold, metal7440-57-50.0170280.0040000.001233
Guanidine compounds1-cyanoguanidine461-58-50.8088300.1900000.058585
Inorganic Silicon compoundsSilicon7440-21-32.0957210.4923000.151796
Iron and its compoundsIron, metal7439-89-60.2890500.0679000.020936
Lead and its compoundsLead, metallic lead and lead alloys7439-92-10.0723690.0170000.005242
Magnesium and its compoundsMagnesium, metal7439-95-40.5057320.1188000.036631
Manganese and its compoundsManganese, metal7439-96-50.1447380.0340000.010484
Miscellaneous substancesProprietary Material-Other miscellaneous substances.0.7279470.1710000.052726
Nickel and its compoundsNickel, metal7440-02-011.6292732.7318000.842324
Organic Silicon compounds[3-(2,3-epoxypropoxy)propyl]trimethoxysilane2530-83-80.0808830.0190000.005858
Organic compounds3,3'-(4-Methylbenzene-1,3-diyl)bis(1,1-dimethylurea)17526-94-20.4044150.0950000.029292
Palladium and its compoundsPalladium, metal7440-05-30.1613400.0379000.011686
PolymersAcrylonitrile-methyl-methacrylate-vinylidene chloride copolymer25036-25-32.4264900.5700000.175754
PolymersBisphenol A, formaldehyde, epichlorohydrin polymer28906-96-93.2353200.7600000.234339
PolymersProprietary Material-Other acrylic/epoxy resin mixture126.00422029.5993009.126653
Titanium and its compoundsTitanium dioxide1317-70-00.4044150.0950000.029292
Zinc and its compoundsZinc, metal7440-66-61.4452510.3395000.104681
Subtotal425.700000100.000000030.834015
Header Assembly/FlangeCopper PlatingCopper and its compoundsCopper, metal7440-50-80.00366399.0000000.000265
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000371.0000000.000003
Subtotal0.003700100.00000000.000268
FlangeCopper and its compoundsCopper, metal7440-50-80.98641899.8500000.071448
Zirconium and its compoundsZirconium, metal7440-67-70.0014820.1500000.000107
Subtotal0.987900100.00000000.071555
Gold PlatingGold and its compoundsGold, metal7440-57-50.00475299.0000000.000344
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.0000481.0000000.000003
Subtotal0.004800100.00000000.000348
Nickel Cobalt PlatingCobalt and its compoundsCobalt, metal7440-48-40.00072020.0000000.000052
Nickel and its compoundsNickel, metal7440-02-00.00288080.0000000.000209
Subtotal0.003600100.00000000.000261
Semiconductor Die 1Semiconductor DieInorganic Silicon compoundsSilicon, doped25.43545998.0000001.842324
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.5190912.0000000.037598
Subtotal25.954550100.00000001.879922
Semiconductor Die 2Semiconductor DieGold and its compoundsGold, metal7440-57-50.1790101.0200000.012966
Inorganic Silicon compoundsSilicon7440-21-317.02357097.0004001.233040
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.3474201.9796000.025164
Subtotal17.550000100.00000001.271170
Semiconductor Die 3Semiconductor DieGold and its compoundsGold, metal7440-57-50.1074061.0200000.007780
Inorganic Silicon compoundsSilicon, doped10.21414297.0004000.739824
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.2084521.9796000.015098
Subtotal10.530000100.00000000.762702
Semiconductor Die 4Semiconductor DieInorganic Silicon compoundsSilicon, doped6.17400098.0000000.447191
Miscellaneous substancesOther miscellaneous substances (less than 10%).0.1260002.0000000.009126
Subtotal6.300000100.00000000.456317
Total1380.618131100.0000000100.0000000
Note(s):
1Some materials contains substances with a generic description as the actual composition of the substances are either considered proprietary or no official CAS number is available. If a CAS number is given, it is the closest match available
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
产品内容声明 A2T23H200W23SR6
Product content declaration of A2T23H200W23SR6
上次修订 Last Revision (GMT):
Thursday, 24 July 2025, 08:04:00 PM
部件名称
Name of the part
均质材料
Homogeneous Material
有毒或有害物质和元素 (Toxic or hazardous Substances and Elements)
铅(Pb)镉(Cd)汞(Hg)六价铬(Cr-VI)多溴联苯(PBB)多溴二苯醚(PBDE)
焊丝-铝
Bonding Wire - Al
焊丝-铝
Bonding Wire - Al
OOOOOO
盖子
Cap
盖子
Cap
OOOOOO
铜引线框架,预镀镍钯金
Copper Lead-Frame, Pre-Plated NiPdAu
铜引线框架,预镀镍钯金
Copper Lead-Frame, Pre-Plated NiPdAu
OOOOOO
封装焊头/法兰
Header Assembly/Flange
镀铜
Copper Plating
OOOOOO

法兰盘
Flange
OOOOOO

镀金材料
Gold Plating
OOOOOO

镍钴电镀
Nickel Cobalt Plating
OOOOOO
半导体芯片
Semiconductor Die 1
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 2
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 3
半导体芯片
Semiconductor Die
OOOOOO
半导体芯片
Semiconductor Die 4
半导体芯片
Semiconductor Die
OOOOOO
O: 表示该有毒有害物质在该部件所有均质材料中的含量均在SJ/T11363-2006标准规定的限量要求以下。
O: Indicates all homogeneous materials hazardous substances content are below the SJ/T11363-2006 MCV limit.
X: 该有毒有害物质至少在该部件的某一均质材料中的含量超出SJ/T11363-2006标准规定的限量要求。
X: Indicates that the hazardous substance content contained in any one of the homogeneous materials of the part exceeded the MCV limits specified in the Standard SJ/T 11363-2006.
备注: 该半导体产品具有无限期的环保使用期限(EFUP)。
Remark: This semiconductor product has an indefinite environmental friendly use period (EFUP).
免责声明
Disclaimer
本文件中的所有信息只为考察或指示目的。本文件中的所有信息被认为是精确和可靠的。然而,恩智浦不对该等信息的精确性和完整性给予任何陈述和保证,且恩智浦不对使用该等信息造成的后果承担责任。恩智浦可以在任何时候对文件中公布的信息加以修改,无需经过通知。不同生产地的产品可能存在微小偏差。本文件取代先于此次公布的所有信息。本文件中任何信息都不能被解释为对承诺开放的销售产品的要约,或者授予、让与或暗示任何版权、专利或者其它工业或知识产权的任何许可。

All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
NXP Semiconductors
Compliance Documentation of A2T23H200W23SR6Last Revision (GMT):
Thursday, 24 July 2025, 08:04:00 PM
SubpartHomogeneous MaterialCertificate of Analysis(CoA)
RoHSPhthalates *Halogens *Antimony *
Bonding Wire - AlTest Report
5 Sep 2025
Test Report
5 Sep 2025
Test Report
5 Sep 2025
Test Report
5 Sep 2025
CapEPOXYTest Report
30 Jun 2021
Test Report
30 Jun 2021
Test Report
13 Mar 2020
Not Available
LCPTest Report
30 Mar 2020
Test Report
30 Mar 2020
Test Report
30 Mar 2020
Not Available
Copper Lead-Frame, Pre-Plated NiPdAuC7025 + NIPDAUTest Report
15 Feb 2022
Test Report
15 Feb 2022
Test Report
15 Feb 2022
Test Report
15 Feb 2022
EPOXYTest Report
13 Mar 2020
Test Report
13 Mar 2020
Test Report
13 Mar 2020
Not Available
LCPTest Report
13 Mar 2020
Test Report
13 Mar 2020
Test Report
13 Mar 2020
Not Available
Header Assembly/FlangeNot AvailableNot AvailableNot AvailableNot Available
Semiconductor Die 1Test Report
22 Oct 2019
Test Report
22 Oct 2019
Test Report
22 Oct 2019
Test Report
22 Oct 2019
Semiconductor Die 2Test Report
1 Jul 2025
Test Report
1 Jul 2025
Test Report
1 Jul 2025
Test Report
1 Jul 2025
Semiconductor Die 3Test Report
7 Aug 2025
Test Report
7 Aug 2025
Test Report
7 Aug 2025
Test Report
7 Aug 2025
Semiconductor Die 4Not AvailableNot AvailableNot AvailableNot Available
For more information: contact us
Note(s):
* NXP does not commit to providing this report for all product materials!
Disclaimer
All information in this document is furnished for exploratory or indicative purposes only. All information in this document is believed to be accurate and reliable. However, NXP does not give any representations or warranties as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. NXP may make changes to information published in this document at any time and without notice. Minor deviations may occur in the products from different manufacturing location. This document supersedes and replaces all information supplied prior to the publication hereof. Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.